Векторный анализатор цепей E5080B

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Самый универсальный и гибкий анализатор цепей серии ENA

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Характеристики

Производитель

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Keysight Technologies

Модель

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E5080B

The New Standard

As devices become highly integrated, complete characterization requires a complete RF and microwave measurement solution. The E5080B provides R&D performance up to 20 GHz and advanced test flexibility. Best-in-class dynamic range, trace noise, and temperature stability guarantee reliability and repeatability.

Wide frequency coverage from 9 kHz to 4.5/6.5/9/14/20 GHz
Fully capture device performance with a wide dynamic range of 140 dB
Achieve complete device characterization with optional built in DC sources, bias tees, pulse generators and pulse modulators
Consistently test between R&D and production with the same UI and SCPI commands as high-end PNAs.
Improve throughput by performing spectrum analysis, pulsed-RF measurements, vector mixer measurements, noise figure, and more on a single instrument

Широкие и гибкие функциональные возможности

Анализатор E5080B позволяет снизить расходы и упростить конфигурирование нескольких приборов. Встроенные аппаратные средства для проведения разнообразных испытаний превращают анализатор E5080B в полнофункциональное измерительное решение.

Для анализатора E5080B доступны следующие опции:

Источники постоянного тока
Генераторы импульсов и импульсные модуляторы
Анализ спектра
Измерения коэффициента шума

Документы

Векторный анализатор цепей E5080B

5,7 Мб

Dynamic Range
The specifications in this section apply to measurements made with the Keysight E5080B ENA Series
vector network analyzer under the following conditions:
• No averaging applied to data

Table 1. System Dynamic Range at Test Port (dB)1
Option 240/260/290/2D0/2H0/2K0/440/460/490/4D0/4H0/4K0/442/462/492/4D2/4H2/4K2 (without bias tee options)

Description	Specification	Typical
9 kHz to 100 kHz	101	111
100 kHz to 300 kHz	117	126
300 kHz to 1 MHz	125	136
1 MHz to 10 MHz	130	141
10 MHz to 50 MHz 2	137	147
50 MHz to 3 GHz	140	150
3 GHz to 5 GHz	140	149
5 GHz to 6.5 GHz	140	148
6.5 GHz to 9 GHz	136	146
9 GHz to 14 GHz	133	142
14 GHz to 16 GHz	130	140
16 GHz to 20 GHz	126	137

Option 2L0/2M0/2N0/2P0/4L0/4M0/4N0/4P0/4L2/4M2/4N2/4P2

Description	Specification	Typical
100 kHz to 300 kHz	95	106
300 kHz to 500 kHz	104	120
500 kHz to 1 MHz	117	130
1 MHz to 10 MHz	125	138
10 MHz to 50 MHz 2	137	147
50 MHz to 6.5 GHz	140	150
6.5 GHz to 8 GHz	138	150
8 GHz to 9 GHz	138	147
9 GHz to 16 GHz	137	147
16 GHz to 17 GHz	137	143
17 GHz to 20 GHz	132	143
20 GHz to 24 GHz	130	143
24 GHz to 25 GHz	130	141
25 GHz to 26 GHz	127	141
26 GHz to 30 GHz	127	137
30 GHz to 35 GHz	122	137
35 GHz to 40 GHz	122	134
40 GHz to 45 GHz	122	132
45 GHz to 50 GHz	99	114
50 GHz to 53 GHz	71	100

1. System dynamic range = source maximum output power minus receiver noise floor at 10 Hz IF bandwidth. Does not include
crosstalk effects.
2. It may typically be degraded at 25 MHz.

Enhanced Time Domain Analysis with TDR (with S96011B/A)
This section provides specifications for the enhanced time domain analysis on the E5080B ENA Series VNA. The S96011B/A Software is required to enable enhanced time domain analysis functions of the E5080B.

Table 45. Key Specifications of Enhanced Time Domain Analysis
Option 240/260/290/2D0/2H0/2K0/440/460/490/4D0/4H0/4K0/442/462/492/4D2/4H2/4K2

Description		Option 2K0/4K0/ 4K2	Option 2H0/4H0/ 4H2	Option 2D0/4D0/ 4D2	Option 290/490/ 492	Option 260/460/ 462	Option 240/440/ 442
Bandwidth	Spec.	20 GHz	18 GHz	14 GHz	9 GHz	6.5 GHz	4.5 GHz
Input impedance	Nom.	50 ohm
DC damage level at test port	Spec.	35 V
Maximum test port input voltage (Hot TDR mode)	Typ.	1.5 Vpp
TDR stimulus 1	Nom.	Step, Impulse
TDR step amplitude 2	Nom.	1 mV to 5 V
TDR step rise time 3 (min) (10% to 90%)	Spec.	22.3 ps	24.8 ps	31.9 ps	49.6 ps	68.6 ps	99.1 ps
TDR step response resolution in free space 4 (εr = 1) (min)	Nom.	3.3 mm	3.7 mm	4.8 mm	7.4 mm	10.3 mm	14.9 mm
TDR impulse width (min) 3	Spec.	30.2 ps	33.6 ps	43.1 ps	67.1 ps	92.9 ps	135 ps
TDR deskew range (max) 5 (test cable length)	Typ.	50 ns	50 ns	50 ns	50 ns	50 ns	50 ns
DUT length (max) 6	Spec.	13.8 μs	13.8 μs	13.8 μs	13.8 μs	13.8 μs	13.8 μs
TDR stimulus repetition rate (max)	Spec.	19.9 MHz	17.9 MHz	13.9 MHz	8.9 MHz	6.4 MHz	4.4 MHz
RMS noise level 7	Typ.	60 μVrms	60 μVrms	60 μVrms	60 μVrms	60 μVrms	60 μVrms
Eye diagram data rate (max) 8	Spec.	16 Gb/s	14.4 Gb/s	11.2 Gb/s	7.2 Gb/s	5.2 Gb/s	3.6 Gb/s

1. The time domain function of the S96011B/A is similar to the time domain reflectometry (TDR) measurement on a TDR oscilloscope
in that it displays the response in the time domain. In the TDR oscilloscope measurement, a pulse or step stimulus is input to the
DUT and the change of the reflected wave over time is measured. In the S96011B/A TDR measurement, a sine wave stimulus is
input to the DUT and the change of the reflected wave over frequency is measured. Then, the frequency domain response is
transformed to the time domain using the Inverse Fourier Transform.
2. The TDR step amplitude setting does not vary the actual stimulus level input to the device but is used when calculating the Inverse
Fourier Transform.
3. Minimum values may be limited by the DUT length setting.
4. To convert from rise time to response resolution, multiply the rise time by c, the speed of light in free space. To calculate the actual
physical length, multiply this value in free space by vf, the relative velocity of propagation in the transmission medium. (Most
cables have a relative velocity of 0.66 for a polyethylene dielectric or 0.7 for a PTFE dielectric.)
5. Using high quality cables to connect the DUT is recommended in order to minimize measurement degradation. The cables should
have low loss, low reflections, and minimum performance variation when flexed.
6. Maximum DUT length is the sum of the DUT and test cable lengths.
7. RMS noise level with 50 Ω DUT and default setup.
8. Maximum values may be limited by the DUT length setting.

Option 2L0/2M0/2N0/2P0/4L0/4M0/4N0/4P0/4L2/4M2/4N2/4P2

Description		Option 2P0/4P0/4P2	Option 2N0/4N0/4N2	Option 2M0/4M0/4M2	Option 2L0/4L0/4L2
Bandwidth	Spec.	53 GHz	44 GHz	32 GHz	26.5 GHz
Input impedance	Nom.	50 ohm
DC damage level at test port	Spec.	35 V
Maximum test port input voltage (Hot TDR mode)	Typ.	1.5 V (100 kHz to 20 GHz) 0.9 V (20 GHz to 30 GHz) 0.7 V (30 GHz to 40 GHz) 0.5 V (40 GHz to 53 GHz)	1.5 V (100 kHz to 20 GHz) 0.9 V (20 GHz to 30 GHz) 0.7 V (30 GHz to 40 GHz) 0.5 V (40 GHz to 44 GHz)	1.5 V (100 kHz to 20 GHz) 0.9 V (20 GHz to 30 GHz) 0.7 V (30 GHz to 32 GHz)	1.5 V (100 kHz to 20 GHz) 0.9 V (20 GHz to 26.5 GHz)
TDR stimulus 1	Nom.	Step, Impulse
TDR step amplitude 2	Nom.	1 mV to 5 V
TDR step rise time 3 (min) (10% to 90%)	Spec.	8.42 ps	10.2 ps	14 ps	16.9 ps
TDR step response resolution in free space 4 (εr = 1) (min)	Nom.	1.3 mm	1.5 mm	2.1 mm	2.5 mm
TDR impulse width (min) 3	Spec.	11.4 ps	13.8 ps	18.9 ps	22.8 ps
TDR deskew range (max) 5 (test cable length)	Typ.	50 ns	50 ns	50 ns	50 ns
DUT length (max) 6	Spec.	1.25 μs	1.25 μs	1.25 μs	1.25 μs
TDR stimulus repetition rate (max)	Spec.	52.9 MHz	43.9 MHz	31.9 MHz	26.4 MHz
RMS noise level 7	Typ.	120 μVrms	80 μVrms	80 μVrms	80 μVrms
Eye diagram data rate (max) 8	Spec	42.4 Gb/s	35.2 Gb/s	25.6 Gb/s	21.2 Gb/s

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