Swept Test System for Optical Components
Swept Test System
IL / WDL / PDL measurement platform for optical components with a fastscan speed, high resolution and accuracy. The systemcombinesour tunable lasers, polarization controller, power meter and software.
Multi-Station Measurement
The Swept Test System combined with the Multi Branch Unit can improve the efficiency of measurements.
Swept Test System for Optical Components
Swept Test System
IL / WDL / PDL measurement platform for optical components with a fastscan speed, high resolution and accuracy. The systemcombinesour tunable lasers, polarization controller, power meter and software.
Multi-Station Measurement
The Swept Test System combined with the Multi Branch Unit can improve the efficiency of measurements.
Our Swept Test System is built combining Santec’s TSL series tunable lasers with multi-port power meters (MPM series) and polarization control unit (PCU-110). Our dedicated software optimizes the system for IL, WDL and PDL measurement for use in both R&D and production environments. Using real-time referencing, while simultaneously acquiring output power from the tunable laser and the transmitted optical power through the DUT, the system provides high accuracy in IL, WDL and PDL analysis using the Muller Matrix Method.
Features & Characteristics
Real-time power referencing
1. Accurate WDL/PDL characteristics measurement
- High power repeatability <±0.02 dB
- High PDL repeatability ±0.01 dB
Rescaling algorithm
1. High wavelength resolution and accuracy
2. Reduced measurement time
Multi-channel measurement is available
Supporting graphical user interface and DLLs (Visual Studio)
1. Convenient set up of measurement parameters
2. Data analysis
WDL (Wavelength Dependent Loss) Measurement High dynamic range measurement of 80 dB or more The Santec tunable laser source TSL series have been outfitted with an innovative cavity design to lower the optical ASE noise, resulting in an extraordinarily high signal-to-noise ratio of over 90 dB / 0.1 nm, while also maintaining a high output power of over + 10 dBm. The TSL series lasers are ideal for next generation components testing driven by innovations in Dense Wavelength Division Multiplexing (DWDM), passives and Wavelength Selective Switches (WSS). The following graphs show the measurement data of a CWDM filter and notch filter, (such as an FBG) respectively.
High wavelength accuracy +/- 3 pm
The Santec tunable laser source TSL series has been equipped with the wavelength monitor as standard, so is ideal for high precision testing of optical passive components. A measurement accuracy of less than a few pm can be confirmed by measuring the absorption lines of Acetylene (12C2H2) gas cell.
High wavelength resolution less than 0.1 pm
The Santec Swept Test System can measure not only WDL measurements of optical components (including Dense Wavelength Division Multiplexing (DWDM), AWG, Wavelength Selective Switches (WSS) and more), but also very narrow filters (i.e., High Q cavity devices) efficiently with high resolution, even during continuous sweeps.
Application
Optical characterization of components and modules:
- Tunable Filters, Interleavers, Fiber Bragg Gratings, Couplers, Splitters, Isolators, Switches, etc
- WSS and Wavelength Blockers
- DWDM components
Silicon photonic material characterization, including micro-cavity ring resonators
Spectroscopy
Interferometry
Configuration Polarization Dependent Loss Measurement
In the multi-station measurement configuration, the TSL, PCU and MBU will act as a server that splits the trigger signal and light beam to different stations. Each station will consist of a client PC and a power meter. During operation, the TSL will sweep continuously allowing each station to work independently and simultaneously with other stations. In this way, the Multi-station measurement configuration can improve the efficiency of measurements for high-accuracy characterization and analysis.
* All specifications are quoted after 1 hour warm-up period. All specifications applies with santec optical power meter MPM-210.
*1: Temperature within 25°C ± 5°C
*2: Temperature within 25°C ± 1°C
*3: Does not include influence of connector.
*4: The measurement condition is within wavelength resolution 5 pm, wavelength range 50 nm for 1 channel.
*5: Measurement dynamic range per scan is up to 40 dB.
