Модульная платформа CTP-10
CTP10 - passive optical component testing platform
Unrivaled passive optical component testing platform for WDM components and photonic integrated circuits
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Unrivaled passive optical component testing platform for WDM components and photonic integrated circuits
Характеристики
Производитель
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EXFO
Модель
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CTP10
Модульная платформа CTP-10
Key features
platform also allows measurement of photocurrent when connected to external photodiodes.
Thanks to its innovative approach, the CTP10 also greatly reduces setup time and simplifies spectral characterization by taking
care of many complex operations. Indeed, the platform directly controls one or several continuously tunable lasers to achieve
high-resolution spectral characterization within seconds. Wavelength sweep, data collection and processing for IL, RL or PDL,
trace display and analysis are all performed from a single instrument, making the CTP10 a compelling, easy-to-use test solution for
passive component characterization. Single‑sweep insertion loss measurements with up to 80 dB dynamic range can be performed
with unprecedented speed and resolution. Thanks to its modular configuration, it is the ideal instrument to characterize large port
count components used in DWDM networks and photonic integrated circuits (PIC).
The platform runs a dedicated operating system with powerful data processing electronics to virtually eliminate any
downtime due to data transfer. It also features a large internal hard drive for direct data storage and full remote control via
SCPI‑compatible commands.
Next-gen platform and modules
Best-in-class IL, RL and PDL over full spectral range
Fast and reliable IL, RL and PDL measurements are key to any R&D or manufacturing passive component test bench.
Other parameters such as isolation, free spectral range or directivity all rely on a high-quality loss measurement.
Thanks to its state-of-the-art electronics, the CTP10 outperforms all existing instruments. It offers a 70 dB dynamic range for IL in a single sweep for a tunable laser speed at 100 nm/s with 10 dBm output power while maintaining a sampling resolution of 1 pm and eliminates post-processing steps such as trace stitching and bandwidth correction.
Each of the key module IL RL OPM2, IL PDL or IL PDL OPM2 is automatically recognized by the CTP10 operating system and unlocks relevant functionalities. For example, when an IL PDL module is in use, the CTP10 will automatically generate known states-of-polarization (SOP), record all relevant spectra in each of those states and calculate both PDL and polarization‑averaged IL using the Mueller method. The IL PDL OPM2 measures high precision PDL from 1260 nm to 1620 nm. Coupling it with an FBC-M module will automatically enable true full-band IL/PDL characterization.
The CTP10 can test components with a high-contrast spectrum, such as wavelength selective switches or DWDM multiplexers, without compromising on the quality of optical power measurement. The module’s detectors have no slew rate issues and can readily measure a change in insertion loss of more than 10 dB/pm at 100 nm/s scanning speed.
- Swept wavelength measurements of insertion loss (IL), polarization dependent loss (PDL) or return loss (RL)
- Industry-first full-band PDL measurement from 1260 to 1620 nm
- >70 dB dynamic range with ±5 pm accuracy and 1 pm resolution in a single sweep at 100 nm/s
- Powerful embedded graphical user interface with advanced built-in analysis functions
- Full automation via SCPI commands
- Scalable architecture for R&D and manufacturing environments
- PIC wafer-level testing
- Multiple-output passive optical component testing in manufacturing and R&D
- WSS and ROADM calibration and tests
- Thin film filters (TFF) characterization
The CTP10 is a modular passive optical component testing platform that combines speed, accuracy and flexibility. It offers reliable,
high-quality IL, RL or PDL measurement regardless of wavelength range or spectral characteristics of the device under test. Theplatform also allows measurement of photocurrent when connected to external photodiodes.
Thanks to its innovative approach, the CTP10 also greatly reduces setup time and simplifies spectral characterization by taking
care of many complex operations. Indeed, the platform directly controls one or several continuously tunable lasers to achieve
high-resolution spectral characterization within seconds. Wavelength sweep, data collection and processing for IL, RL or PDL,
trace display and analysis are all performed from a single instrument, making the CTP10 a compelling, easy-to-use test solution for
passive component characterization. Single‑sweep insertion loss measurements with up to 80 dB dynamic range can be performed
with unprecedented speed and resolution. Thanks to its modular configuration, it is the ideal instrument to characterize large port
count components used in DWDM networks and photonic integrated circuits (PIC).
The platform runs a dedicated operating system with powerful data processing electronics to virtually eliminate any
downtime due to data transfer. It also features a large internal hard drive for direct data storage and full remote control via
SCPI‑compatible commands.
Next-gen platform and modules
Thanks to its innovative approach, the CTP10 also greatly reduces setup time and simplifies spectral characterization by taking care of many complex operations. Indeed, tunable laser sweep, data collection and processing for IL, RL or PDL, trace display and analysis are all performed from a single instrument.
The CTP10 platform is compatible with a choice of key modules for spectral characterization (IL PDL & IL PDL OPM2 modules or IL RL OPM2), wavelength control modules (SCAN SYNC and FBC module) and detection modules (OPMx module). These fully integrated modules are hot-swappable to greatly reduce setup time and provide a flexible and evolutive test solution.
The CTP10 has an embedded operating system for handling and processing large amounts of data. It also offers a scalable architecture by sharing one or several tunable lasers among up to 8 test stations and by adding a secondary mainframe for 100+ ports testing.
Unparalleled performance
The CTP10 offers uncompromising performance and maintains best-in-class specifications at full speed over the full wavelength range of operation with an integrated setup. This combination of speed, accuracy, integration and spectral coverage is unprecedented on the market and ideal as a future-proof testing solution on next generation components such as wavelength selective switches (WSS) or ring-resonators.
The range-free series of OPMx optical detectors can measure a dynamic range of >70 dB in a single sweep at 100 nm/s, with a 1-pm resolution, drastically increasing throughput in manufacturing and R&D. The OPMx detectors can also accurately measure extremely sharp spectral features of up to 10 dB/pm (10,000 dB/nm).
Powerful intuitive GUI
The CTP10 has been developed around three key principles: integration, performance and automation. Its embedded software offers a powerful and intuitive GUI that seamlessly controls the measurement process to let you focus on what really matters: measurement data and analysis. Additionally, the CTP10 offers full remote control via SCPI‑compatible commands.
The CTP10 platform is compatible with a choice of key modules for spectral characterization (IL PDL & IL PDL OPM2 modules or IL RL OPM2), wavelength control modules (SCAN SYNC and FBC module) and detection modules (OPMx module). These fully integrated modules are hot-swappable to greatly reduce setup time and provide a flexible and evolutive test solution.
The CTP10 has an embedded operating system for handling and processing large amounts of data. It also offers a scalable architecture by sharing one or several tunable lasers among up to 8 test stations and by adding a secondary mainframe for 100+ ports testing.
Unparalleled performance
The CTP10 offers uncompromising performance and maintains best-in-class specifications at full speed over the full wavelength range of operation with an integrated setup. This combination of speed, accuracy, integration and spectral coverage is unprecedented on the market and ideal as a future-proof testing solution on next generation components such as wavelength selective switches (WSS) or ring-resonators.
The range-free series of OPMx optical detectors can measure a dynamic range of >70 dB in a single sweep at 100 nm/s, with a 1-pm resolution, drastically increasing throughput in manufacturing and R&D. The OPMx detectors can also accurately measure extremely sharp spectral features of up to 10 dB/pm (10,000 dB/nm).
Powerful intuitive GUI
The CTP10 has been developed around three key principles: integration, performance and automation. Its embedded software offers a powerful and intuitive GUI that seamlessly controls the measurement process to let you focus on what really matters: measurement data and analysis. Additionally, the CTP10 offers full remote control via SCPI‑compatible commands.
Best-in-class IL, RL and PDL over full spectral range
Fast and reliable IL, RL and PDL measurements are key to any R&D or manufacturing passive component test bench.
Other parameters such as isolation, free spectral range or directivity all rely on a high-quality loss measurement.
Thanks to its state-of-the-art electronics, the CTP10 outperforms all existing instruments. It offers a 70 dB dynamic range for IL in a single sweep for a tunable laser speed at 100 nm/s with 10 dBm output power while maintaining a sampling resolution of 1 pm and eliminates post-processing steps such as trace stitching and bandwidth correction.
Each of the key module IL RL OPM2, IL PDL or IL PDL OPM2 is automatically recognized by the CTP10 operating system and unlocks relevant functionalities. For example, when an IL PDL module is in use, the CTP10 will automatically generate known states-of-polarization (SOP), record all relevant spectra in each of those states and calculate both PDL and polarization‑averaged IL using the Mueller method. The IL PDL OPM2 measures high precision PDL from 1260 nm to 1620 nm. Coupling it with an FBC-M module will automatically enable true full-band IL/PDL characterization.
The CTP10 can test components with a high-contrast spectrum, such as wavelength selective switches or DWDM multiplexers, without compromising on the quality of optical power measurement. The module’s detectors have no slew rate issues and can readily measure a change in insertion loss of more than 10 dB/pm at 100 nm/s scanning speed.
Документы
| OPTICAL MEASUREMENT | ||||
| With IL PDL | With IL PDL OPM2 | With IL RL OPM2 | ||
| Wavelength | Specified wavelength range | 1510 nm–1620 nm | 1260 nm–1620 nm | 1250 nm–1630 nm |
| Operating wavelength range b | 1440 nm–1640 nm | 1240 nm–1680 nm | ||
| Absolute wavelength uncertainty (typical) | ±5 pm | |||
| Wavelength repeatability (typical) c | ±1 pm | |||
| Wavelength display resolution | 1 pm to 2000 pm | |||
|
Optical interfaces |
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| Maximum safe power | 11 dBm | |||
| Averaging time | Manual: 1 μs to 1 s, automatic | |||
| Optical power acquisition resolution | < 0.0001 dB | |||
| Return loss (typical) | > 56 dB | |||
| Optical interfaces | Optical connectors | FC type | ||
| Maximum safe power |
TLS IN: 15 dBm SCAN SYNC: 14 dBm |
|||
| Insertion loss d | Dynamic range (typical at 10 nm/s) | > 80 dB | ||
| Dynamic range (typical at 100 nm/s) | > 70 dB | |||
| Insertion loss uncertainty (typical at 10 nm/s) e | ±0.005 dB | |||
| Noise 2 s (at 10 nm/s) (typical) |
0 dB to 20 dB: ±0.005 dB 20 dB to 40 dB: ±0.005 dB 40 dB to 50 dB: ±0.010 dB 50 dB to 60 dB: ±0.035 dB |
|||
| Noise 2 s (at 100 nm/s) (typical) |
0 dB to 20 dB: ±0.005 dB 20 dB to 40 dB: ±0.010 dB 40 dB to 50 dB: ±0.050 dB 50 dB to 60 dB: ±0.400 dB |
|||
| Polarization dependent loss | PDL measurement method | 4-States Mueller | N/A | |
| PDL uncertainty (typical at 100 nm/s) f | ±0.06 dB + 2% PDL | ±0.06 dB + 1% PDLg | N/A | |
| Return loss | Dynamic range (typical at 10 nm/s) | N/A | > 55 dB | |
| Return loss uncertainty (typical) h | N/A | ±0.5 dB | ||
| Swept measurement | Measurable power variation (typical) i | >10 000 dB/nm at 100 nm/s | ||
| Optimum tunable laser sweep speed range | 10 nm/s–100 nm/s | |||
a. After a 1-hour warm-up time (for the CTP10 mainframe and modules), at a constant temperature of 23 °C ±1 °C, SMF28 patchcord, FC/APC connector, T100S-HP laser used with SCAN SYNC module, unless otherwise specified.
b. When using SCAN SYNC, first and last 2.5 nm of the laser(s) wavelength scanning range are not usable.
c. Over one minute, within optimum tunable laser sweep speed range, laser optical power 10 dBm.
d. Tunable laser power 10 dBm, after zeroing of optical detector, averaging time set to Automatic and without FBC module in optical path.
e. For IL < 20 dB, after power referencing, not including connector uncertainty, degree of polarization < 5%.
f. For PDL <2 dB and IL <20 dB; 10 dBm TLS, auto avg. time, FC/PC connector to OPM. Higher PDL values can be displayed depending on measurement conditions.
g. ±0.04 dB + 1% PDL over spectral range 1490 nm – 1620 nm
h. For RL < 40 dB, degree of polarization < 5%.
i. For IL < 45 dB, tunable laser power +10 dBm and averaging time set to 1 μs.