Product Overview
X series is an integrated and highly efficient semi-automatic wafer probe platform that is specialized in testing the performance of various advanced chips. It integrates various functions such as electric light wave and microwave, etc. It has the highest temperature width and test accuracy in the industry at present, and can match various test application environments, providing reliability wafer testing within -60 ~300 wide temperature range. ***Custom design solutions for special dimension or performance are possibile on request.
Basic Information
Product number: X6/X8/X12
Electricity demand: 220V,50~60Hz
Product Size: 1060mm*1610mm*1500mm (L*W*H)
Working environment: Open type
Control method: Semi-Automatic
Equipment weight: About 1500 kg
Application direction
Technical characteristics
The industry's most efficient CHUCK system, test efficiency increased by more than 40%
- -60 ~300 is the highest temperature wide area in the industry, with temperature control accuracy and stability better than 0.08, providing reliability wafer testing in high and low temperature environments.
- The compact structure design of four-dimensional motion with low center of gravity ensures the motion speed of 70mm/s while maintaining the stability of motion acceleration and deceleration.
Industry leading 3 times imaging technology
Auxiliary CHUCK module silicon wafer safe upper and lower
- Compared with other brands in the industry, the probe table cavity of SEMISHARE can be opened once and pulled out the entire Chuck mechanism to load and load silicon wafers at a speed of 370mm with a long stroke. The manual feeding of the Wafer is more convenient and faster.Meanwhile, the Chuck's rotation Angle range is larger, which requires lower demand for manual laying wafer, and the operation is more flexible and convenient.
Design of O-type needle seat platform
The probe testing system adopts the O-type needle seat platform design, which makes the most efficient use of the space of the needle seat, up to 12 needle seats can be placed at the same time. Compared with other probe brands in the market, the number of the needle seat is increased by 50%, effectively realizing more efficient and rapid testing.
Air film shock absorption system
The industry's unique internal integration of high-performance air film shock absorption system and the dual design of the external isolation barrier, effectively avoid the vibration caused by the operator's touch;In addition, a long-aging casting is used as the substrate to suppress the vibration in the process of motion at the fastest speed of 1S in the industry to ensure the stable operation of the equipment, and to ensure that the screen does not shake when the image is enlarged at 2000X;At the same time, the high-precision control valve ensures that the height error of the moving part of the platform is 0.1mm, effectively realizing the test ability of fast DIE to die, ensuring that the whole system can still maintain a stable running state when moving at a high speed, and greatly improving the test efficiency.
Anti-interference shielding system
Independent research and development of software integration system, more compatibility
- Automatic Wafer calibration automatic Wafer mapping automatic die size measurement automatic align automatic test data can be accessed remotely.
- Automatic calibration of RF probe module with one key, automatic needle clearing function.
- One-key adaptive four-axis Chuck precision calibration, supporting micron pad point measurement.
- Single point or continuous testing can be supported.
- Strong data storage capacity and data processing capacity.
- The bin value can be divided to determine the device NG.
- Multi-system integration to upgrade the operating system application system and device test system independently.
- Intuitive and simple operation design, quick and easy operation, effective saving operation training time.
Flexible optional configuration and extension
Convenient instrument access and support system automatic expansion and upgrade, temperature control system loading;There are also a variety of test modules available. According to the test module, it can be used together with a variety of positioner fixtures, needle CARDS and probe tables, such as six-axis positioner RF cables.Many system operating parameters and features reach the highest level of the industry, can meet your different test needs, but also an ideal choice for more industry customers a semi-automatic probe table equipment.
