Integrated photonics can include complex optical components with high-contrast spectrum. For instance, a ring resonator may have very sharp features making it difficult to characterize insertion loss. In addition to insertion loss, some devices require extended measurements of return loss or polarization dependent loss, with the same level of precision. Finally, simultaneous testing of many devices or outputs from one single device is also required to speed up PIC characterization. To test such devices, the T200S laser can be jointly operated with the CTP10, EXFO’s component testing platform. With high-resolution and high-accuracy spectral measurement, the CTP10 is an integrated solution that leverages the full potential of the T200S for operations at 200 nm/s sweep speed. The T200S is also compatible with the CT440, EXFO’s compact component tester operating at 100 nm/s.
10 dBm output power with high spectral purity: Laser exhibits a crystal-clear optical spectrum at a nominal optical output power of 10 dBm over the entire tuning range. Optical cavity eliminates broadband source spontaneous emission (SSE) without any compromise on optical power.
High spectral purity is maintained throughout the laser sweep through active mode-hop control, ensuring reliable and repeatable wavelength sweeps
High-speed tunability: Laser scanning speed is 100 nm/s and can be configured with an optional 200 nm/s scanning speed. When speed is critical, the T200S ensures repeatable yet fast measurements. Otherwise, the laser can be set to slower scanning speeds (e.g., for legacy detection systems)."
Step-by-step or continuously swept wavelength scans: Two user modes at hand, optimized for specific usage: TUN
Step-by-step or continuously swept wavelength scans: Two user modes at hand, optimized for specific usage: TUNE or SWEEP. With TUNE, laser control ensures excellent linewidth at any wavelength or provides rapid “go-to” wavelength tuning. SWEEP performs high-speed mode-hop-free scans over the full wavelength range of the laser.